Texas Instruments SN74AUP1G07 Product Info

Parameters

Technology family	AUP
Supply voltage (min) (V)	0.8
Supply voltage (max) (V)	3.6
Number of channels	1
IOL (max) (mA)	4
Supply current (max) (µA)	0.9
IOH (max) (mA)	0
Input type	Standard CMOS
Output type	Open-drain
Features	Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns)
Rating	Catalog
Operating temperature range (°C)	-40 to 85

DSBGA (YFP)-4-1 mm² 1 x 1

Available in the Ultra Small 0.64 mm² Package (DPW) with 0.5-mm Pitch
Low Static-Power Consumption
(I_CC = 0.9 µA Maximum)
Low Dynamic-Power Consumption
(C_pd = 1 pF Typical at 3.3 V)
Low Input Capacitance (C_i = 1.5 pF Typical)
Low Noise – Overshoot and Undershoot
<10% of V_CC
I_off Supports Live Insertion, Partial-Power-Down Mode, and Back-Drive Protection
Input Hysteresis Allows Slow Input Transition and Better Switching Noise Immunity at the Input
(V_hys = 250 mV Typ at 3.3 V)
Wide Operating V_CC Range of 0.8 V to 3.6 V
Optimized for 3.3-V Operation
3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
t_pd = 3.3 ns Maximum at 3.3 V
Suitable for Point-to-Point Applications
Latch-Up Performance Exceeds 100 mA
Per JESD 78, Class II
ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
  (A114-B, Class II)
- 1000-V Charged-Device Model (C101)

Available in the Ultra Small 0.64 mm² Package (DPW) with 0.5-mm Pitch
Low Static-Power Consumption
(I_CC = 0.9 µA Maximum)
Low Dynamic-Power Consumption
(C_pd = 1 pF Typical at 3.3 V)
Low Input Capacitance (C_i = 1.5 pF Typical)
Low Noise – Overshoot and Undershoot
<10% of V_CC
I_off Supports Live Insertion, Partial-Power-Down Mode, and Back-Drive Protection
Input Hysteresis Allows Slow Input Transition and Better Switching Noise Immunity at the Input
(V_hys = 250 mV Typ at 3.3 V)
Wide Operating V_CC Range of 0.8 V to 3.6 V
Optimized for 3.3-V Operation
3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
t_pd = 3.3 ns Maximum at 3.3 V
Suitable for Point-to-Point Applications
Latch-Up Performance Exceeds 100 mA
Per JESD 78, Class II
ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
  (A114-B, Class II)
- 1000-V Charged-Device Model (C101)

The SN74AUP1G07 device is a single buffer gate with open drain output that operates from 0.8 V to 3.6 V.