Analog Devices MAX5318 Product Info

• Ideal for ATE and High-Precision Instruments
  • INL Accuracy Guaranteed with ±2 LSB (max) Over Temperature
• Fast Settling Time (3µs) with 10kΩ || 100pF Load
• Safe Power-Up-Reset to Zero or Midscale DAC Output (Pin-Selectable)
  • Predetermined Output Device State in Power-Up and Reset in System Design
• Negative Supply (AVSS) Option Allows Full INL and DNL Performance to 0V
• SPI Interface Compatible with 1.8V to 5.5V Logic
• High Integration Reduces Development Time and PCB Area
  • Buffered Voltage Output Directly Drives 2kΩ Load Rail-to-Rail
  • Integrated Reference Buffer
  • No External Amplifiers Required
• Small 4.4mm × 7.8mm, 24-Pin TSSOP Package

The MAX5318 is a high-accuracy, 18-bit, serial SPI input, buffered voltage output digital-to-analog converter (DAC) in a 4.4mm x 7.8mm, 24-lead TSSOP package. The device features ±2 LSB INL (max) accuracy and a ±1 LSB DNL (max) accuracy over the full temperature range of -40°C to +105°C.

The DAC voltage output is buffered resulting in a fast settling time of 3µs and a low offset and gain drift of ±0.5ppm/°C of FSR (typ). The force-sense output (OUT) maintains accuracy while driving loads with long lead lengths. Additionally, a separate AVSS supply, allows the output amplifier to go to 0V (GND) while maintaining full linearity performance.

The MAX5318 includes user-programmable digital gain and offset correction to enable easy system calibration.

At power-up, the device resets its outputs to zero or midscale. The wide 2.7V to 5.5V supply voltage range and integrated low-drift, low-noise reference buffer amplifier make for ease of use.

The MAX5318 features a 50MHz, 3-wire, SPI interface. The MAX5318 is available in a 24-lead TSSOP package and operates over the -40°C to +105°C temperature range.

Applications

• Automatic Test Equipment
• Automatic Tuning and Calibration
• Communication Systems
• Data-Acquisition Systems
• Gain and Offset Adjustment
• Medical Imaging
• Process Control and Servo Loops
• Programmable Voltage and Current Sources
• Test and Measurement Equipment