0
UCC21330-Q1
  • UCC21330-Q1
  • UCC21330-Q1

UCC21330-Q1

ACTIVE

Automotive, 3kVRMS 4A/6A two-channel gate driver with disable logic and programmable deadtime

Texas Instruments UCC21330-Q1 Product Info

1 April 2026 1

Parameters

Number of channels

2

Isolation rating

Basic

Power switch

IGBT, MOSFET, SiCFET

Withstand isolation voltage (VISO) (Vrms)

3000

Working isolation voltage (VIOWM) (Vrms)

850

Transient isolation voltage (VIOTM) (VPK)

4242

Peak output current (A)

6

Peak output current (source) (typ) (A)

4

Peak output current (sink) (typ) (A)

6

Features

Disable, High CMTI, Programmable dead time

Output VCC/VDD (min) (V)

9.2

Output VCC/VDD (max) (V)

25

Input supply voltage (min) (V)

3

Input supply voltage (max) (V)

5.5

Input threshold

CMOS, TTL

Operating temperature range (°C)

-40 to 150

Rating

Automotive

Fall time (ns)

8

Undervoltage lockout (typ) (V)

5, 8, 12

TI functional safety category

Functional Safety-Capable

Package

SOIC (D)-16-59.4 mm² 9.9 x 6

Features

  • Universal: dual low-side, dual high-side or halfbridge driver

  • AEC-Q100 qualified with the following results
    • Device temperature grade 1
  • Junction temperature range –40 to +150°C
  • Up to 4A peak source and 6A peak sink output
  • Common-mode transient immunity (CMTI) greater than 125V/ns
  • Up to 25V VDD output drive supply
    • 5V,8V,12V VDD UVLO options
  • Switching parameters:
    • 33ns typical propagation delay
    • 5ns maximum pulse-width distortion
    • 10µs maximum VDD power-up delay
  • UVLO protection for all power supplies
  • Fast disable for power sequencing
  • Universal: dual low-side, dual high-side or halfbridge driver

  • AEC-Q100 qualified with the following results
    • Device temperature grade 1
  • Junction temperature range –40 to +150°C
  • Up to 4A peak source and 6A peak sink output
  • Common-mode transient immunity (CMTI) greater than 125V/ns
  • Up to 25V VDD output drive supply
    • 5V,8V,12V VDD UVLO options
  • Switching parameters:
    • 33ns typical propagation delay
    • 5ns maximum pulse-width distortion
    • 10µs maximum VDD power-up delay
  • UVLO protection for all power supplies
  • Fast disable for power sequencing

Description

The UCC21330-Q1 is an isolated dual channel gate driver family with programmable dead time and wide temperature range. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, SiC, GaN, and IGBT transistors.

The UCC21330-Q1 can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. The input side is isolated from the two output drivers by a 3kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI).

Protection features include: resistor programmable dead time, disable feature to shut down both outputs simultaneously, and integrated de-glitch filter that rejects input transients shorter than 5ns. All supplies have UVLO protection.

With all these advanced features, the UCC21330-Q1 device enables high efficiency, high power density, and robustness in a wide variety of power applications.

The UCC21330-Q1 is an isolated dual channel gate driver family with programmable dead time and wide temperature range. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, SiC, GaN, and IGBT transistors.

The UCC21330-Q1 can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. The input side is isolated from the two output drivers by a 3kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI).

Protection features include: resistor programmable dead time, disable feature to shut down both outputs simultaneously, and integrated de-glitch filter that rejects input transients shorter than 5ns. All supplies have UVLO protection.

With all these advanced features, the UCC21330-Q1 device enables high efficiency, high power density, and robustness in a wide variety of power applications.

Subscribe to Welllinkchips !
Your Name
* Email
Submit a request