0
ACTIVE
Resolution (Bits) |
16 |
Number of DAC channels |
2 |
Interface type |
Parallel CMOS |
Sample/update rate (Msps) |
500 |
Features |
High Performance |
Rating |
HiRel Enhanced Product |
Interpolation |
1x, 2x, 4x, 8x |
Power consumption (typ) (mW) |
1410 |
SFDR (dB) |
78 |
Architecture |
Current Sink |
Operating temperature range (°C) |
-55 to 125 |
Reference type |
Int |
HTQFP (PZP)-100-256 mm² 16 x 16
(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.