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ADC34RF55
  • ADC34RF55
  • ADC34RF55
  • ADC34RF55

ADC34RF55

ACTIVE

Quad-channel, 14-bit, 3-GSPS, low noise spectral density (NSD), RF-sampling ADC

Texas Instruments ADC34RF55 Product Info

1 April 2026 1

Parameters

Sample rate (max) (Msps)

3000

Resolution (Bits)

14

Number of input channels

4

Interface type

JESD204B

Analog input BW (MHz)

2700

Features

High Dynamic Range, High Performance, Ultra High Speed

Rating

Catalog

Peak-to-peak input voltage range (V)

1.1

Power consumption (typ) (mW)

4900

SNR (dB)

63.8

ENOB (Bits)

10

SFDR (dB)

78

Operating temperature range (°C)

-40 to 85

Input buffer

No

Package

VQFNP (RTD)-64-81 mm² 9 x 9

Features

  • 14-Bit, quad channel 3-GSPS ADC
  • Max output rate: 1.5-GSPS
  • Noise spectral density:
    • -156 dBFS/Hz without averaging
    • -158 dBFS/Hz with 2x averaging
  • Single core (non-interleaved) ADC architecture
  • Aperture jitter: 50 fs
  • Low close-in residual phase noise:
    • -127 dBc/Hz at 10 kHz offset
  • Spectral performance (f IN = 0.9 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 62.3 dBFS
    • SFDR HD2,3: 63 dBc
    • SFDR worst spur: 85 dBFS
  • Spectral performance (f IN = 1.8 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 63 dBFS
    • SFDR HD2,3: 68 dBc
    • SFDR worst spur: 86 dBFS
  • Input full scale: 1.1, 1.35 Vpp (2, 3.5 dBm)
  • Code error rate (CER): 10 -15
  • Full power input bandwidth (-3 dB): 2.75 GHz
  • JESD204B serial data interface
    • Maximum lane rate: 13 Gbps
    • Supports subclass 1 deterministic latency
  • Digital down-converters
    • Up to two DDC per ADC channel
    • Complex output: 4x to 128x decimation
    • 48-bit NCO phase coherent frequency hopping
    • Fast frequency hopping: < 1 µs
  • Power consumption: 1.2 W/channel
  • Power supplies: 1.8 V, 1.2 V
  • 14-Bit, quad channel 3-GSPS ADC
  • Max output rate: 1.5-GSPS
  • Noise spectral density:
    • -156 dBFS/Hz without averaging
    • -158 dBFS/Hz with 2x averaging
  • Single core (non-interleaved) ADC architecture
  • Aperture jitter: 50 fs
  • Low close-in residual phase noise:
    • -127 dBc/Hz at 10 kHz offset
  • Spectral performance (f IN = 0.9 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 62.3 dBFS
    • SFDR HD2,3: 63 dBc
    • SFDR worst spur: 85 dBFS
  • Spectral performance (f IN = 1.8 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 63 dBFS
    • SFDR HD2,3: 68 dBc
    • SFDR worst spur: 86 dBFS
  • Input full scale: 1.1, 1.35 Vpp (2, 3.5 dBm)
  • Code error rate (CER): 10 -15
  • Full power input bandwidth (-3 dB): 2.75 GHz
  • JESD204B serial data interface
    • Maximum lane rate: 13 Gbps
    • Supports subclass 1 deterministic latency
  • Digital down-converters
    • Up to two DDC per ADC channel
    • Complex output: 4x to 128x decimation
    • 48-bit NCO phase coherent frequency hopping
    • Fast frequency hopping: < 1 µs
  • Power consumption: 1.2 W/channel
  • Power supplies: 1.8 V, 1.2 V

Description

The ADC34RF55 is a single core 14-bit, 3-GSPS, quad channel analog to digital converters (ADC) that support RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR), and delivers a noise spectral density of -156 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -158 dBFS/Hz.

Each ADC channel can be connected to a dual-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs.

The devices supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13Gbps. There are only 2 serdes lanes per ADC channel. Therefore, in bypass mode, the maximum output data rate supported is 1.5GSPS. When using faster ADC sampling rates on chip, decimation is required.

The power efficient ADC architecture consumes 1.2W/ch and provides power scaling with lower sampling rates.

The ADC34RF55 is a single core 14-bit, 3-GSPS, quad channel analog to digital converters (ADC) that support RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR), and delivers a noise spectral density of -156 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -158 dBFS/Hz.

Each ADC channel can be connected to a dual-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs.

The devices supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13Gbps. There are only 2 serdes lanes per ADC channel. Therefore, in bypass mode, the maximum output data rate supported is 1.5GSPS. When using faster ADC sampling rates on chip, decimation is required.

The power efficient ADC architecture consumes 1.2W/ch and provides power scaling with lower sampling rates.

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