0
In Production
Capacitive Load Drive |
2,500 pF in 25 ns |
MOSFET Driver Type |
Low Side |
Supply Voltage Max V (volt) |
18 |
Peak Sink Current A (ampere) |
6 |
Peak Source Current A (ampere) |
6 |
Propagation Delay tD1 ns (nanosecond) |
55 |
Propagation Delay tD2 ns (nanosecond) |
55 |
Sink Resistance Ω (ohm) |
2.5 |
Source Resistance Ω (ohm) |
2.8 |
Fall Time tF ns (nanosecond) |
25 |
Rise Time tR ns (nanosecond) |
25 |
# of Outputs |
1 |
Output Type |
Inverting |
Integrated MOSFETs |
External |
Peak Low-Side Source Current (Ampere) |
6 |
Supply Voltage Min V (volt) |
4.5 |
Low-Side Source Resistance Typ (Ohms) Ω (ohm) |
2.1 |
Low-Side Sink Resistance Typ (Ohms) Ω (ohm) |
1.5 |
Low-Side Rise Time (ns) |
25 |
Low-Side Fall Time (ns) |
25 |
Low-Side Turn-On Prop Delay (ns) |
55 |
Low Side Turn-off Propagation delay (ns) |
55 |
Temp Range (T-Junction) Min °C (degrees Celsius) |
- |
Temp Range (T-Junction) Max °C (degrees Celsius) |
150 |
Temp Range (T-Ambient) Min °C (degrees Celsius) |
-40 |
Temp Range (T-Ambient) Max °C (degrees Celsius) |
125 |
Output Configuration |
Low-Side |
The TC4420/4429 are 6 A (peak),single output MOSFET gate drivers. The TC4429 is an inverting gate driver (pin-compatible with the TC429), while the TC4420 is a non-inverting gate driver. These gate drivers are fabricated in CMOS for lower power, more efficient operation versus bipolar drivers. Both devices have TTL-compatible inputs, which can be driven as high as VDD + 0.3 V or as low as -5 V without upset or damage to the device. This eliminates the need for external level shifting circuitry and its associated cost and size. The output swing is rail-to-rail ensuring better drive voltage margin, especially during power up/power down sequencing. Propagational delay time is only 55 ns (typical) and the output rise and fall times are only 25 ns (typical) into 2,500 pF across the usable power supply range. Unlike other gate drivers, the TC4420/4429 are virtually latch-up proof. They replace three or more discrete components saving PCB area, parts and improving overall system reliability.