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PRODUCTION
The MAX9979 fully integrated, high-performance, dual-channel pin electronics integrates multiple automatic test equipment (ATE) functions into a single IC, including driver/comparator/load (DCL), parametric measurement unit (PMU), and built-in (16-bit) level-setting digital-to-analog converters (DACs). The device is ideal for memory and SOC tester applications. Each channel includes a four-level pin driver, window comparator, differential comparator, dynamic clamps, a versatile PMU, an active load, a high-voltage (VHH) programmable level, and 14 independent level-setting DACs. The MAX9979 features programmable cable-droop compensation for the driver output and for the comparator input, adjustable driver output resistance that allows optimal performance over typical data-path transmission-line variations, slew-rate adjustment, and a programmable high-voltage driver output.
The MAX9979 driver features a wide 8V (-1.5V to +6.5V) high-speed operating voltage range and a VHH programmable range of up to +13V. Operation modes include high-impedance, active-termination (3rd-level drive) and VHH (4th-level drive) modes. The device is highly linear even at low voltage swings. The driver provides high-speed differential control inputs compatible with most high-speed logic families. The window comparators provide extremely low timing variation over changes in slew rate, pulse width, and overdrive voltage. In high-impedance mode, the MAX9979 features dynamic clamps that dampen high-speed device-under-test (DUT) waveforms. The 20mA active load facilitates fast contact testing when used in conjunction with the comparators, and functions as a pullup/pulldown for open-drain/collector DUT outputs. The PMU offers five current ranges from ±2µA to ±50mA and can force and measure current or voltage. An SPI™-compatible serial interface configures the MAX9979.
The MAX9979 is available in a small footprint,