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MAX32000
  • MAX32000
  • MAX32000

MAX32000

LAST TIME BUY

High-Speed Quad Driver with Integrated DACs, Cable-Droop Compensation, Slew-Rate Control, and VHH Fourth-Level Drive Industry's Fastest Quad-Channel Driver with Widest -2V to +6V Operating Range

Analog Devices MAX32000 Product Info

10 February 2026 6

Features

  • Low Power at High-Speed Maximizes Driver Performance
    • 700mW per Channel
    • 2.57Gbps at +1V Programmed
    • 280ps Typical Rise/Fall Times at +2V (20% to 80%)
    • Very Low Timing Dispersion at 50ps Typical
    • Wide Voltage Range from -2V to +6V
    • Integrated VHH Programming Mode (4th-Level Drive) Up to 13V
    • 100nA Low-Leak Mode
  • Integrated Functionality Provides Value-Added Features
    • Programmable Double Time Constant Cable-Droop Compensation
    • Digital Slew-Rate Control for EMI Sensitive Applications
    • Adjustable Output Resistance with 360mΩ Resolution
    • 22 DACs to Generate DC Voltage Levels for Control and Monitoring
    • 50MHz SPI Interface
  • Part details & applications

    The MAX32000 is a fully integrated, quad-channel, high-performance pin-electronics driver with built-in level-setting DACs, ideal for memory and SOC ATE systems. Each MAX32000 channel includes a four-level pin driver, programmable cable-droop compensation, five 14-bit DACs, and a comparator that is useful for AC calibration.

    The driver features a wide -2V to +6V operating range and a data rate of 1200Mbps at +2V operation, and in high-voltage mode (VHH mode) offers an output voltage range of 0 to 13V. The device includes high impedance, active termination (3rd-level drive), and is highly linear even at low voltage swings. The calibration comparators and multiplexer provide a timing calibration path for each channel. A serial interface configures the device, easing PCB signal routing.

    The MAX32000 is available in a 64-pin TQFP-EPR package with top-side exposed pad.

    Applications

    • Burn-In Testers
    • Digital Testers
    • Discrete Component ATE
    • Memory Testers
    • SOC Testers
    • Wafer Testers

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