0
ACTIVE
Technology family |
ALVC |
Supply voltage (min) (V) |
1.65 |
Supply voltage (max) (V) |
3.6 |
Number of channels |
4 |
Inputs per channel |
2 |
IOL (max) (mA) |
24 |
IOH (max) (mA) |
-24 |
Input type |
Standard CMOS |
Output type |
Push-Pull |
Features |
Ultra high speed (tpd <5ns) |
Data rate (max) (Mbps) |
150 |
Rating |
HiRel Enhanced Product |
Operating temperature range (°C) |
-40 to 85 |
SOIC (D)-14-51.9 mm² 8.65 x 6
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The SN74ALVC00 quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.
The device performs the Boolean function Y = (A B) or Y = A + B in positive logic.
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