0
LM57
  • LM57
  • LM57
  • LM57
  • LM57
  • LM57

LM57

ACTIVE

±0.7°C Temperature Sensor with Resistor-Programmable Temperature Switch

Texas Instruments LM57 Product Info

1 April 2026 0

Parameters

Setpoint type

Resistor Programmable

Setpoint value (°C)

-40 to 150

Operating temperature range (°C)

-50 to 150

Accuracy over temp range (max) (°C)

1.5

Sensor gain (mV/°C)

-12.9, -10.3, -7.7, -5.2

Output type

Open drain, Push Pull

Supply voltage (min) (V)

2.4

Supply voltage (max) (V)

5.5

Supply current (typ) (µA)

24

Number of comparator channels

1

Features

Built-in hysteresis, Trip-Test Pin

Rating

Catalog

Interface type

Analog output, Switch

Package

TSSOP (PW)-8-19.2 mm² 3 x 6.4

Features

  • See LM57-Q1 datasheet for AEC-Q100 Grade 1/Grade 0/Grade 0 Extended (Qualified and Manufactured on an Automotive Grade Flow)
  • Trip Temperature Set by External Resistors with
    Accuracy of ±1.7°C or ±2.3°C from -40°C to +150°C
  • Resistor Tolerance Contributes Zero Error
  • Push-Pull and Open-Drain Switch Outputs
  • Wide Operating Temperature and Trip-Temperature Range of −50°C to 150°C,
  • Very Linear Analog VTEMP Temp Sensor Output
    with ±0.8°C or ±1.3°C Accuracy from -40°C to +150°C
  • Short-Circuit Protected Analog and Digital Outputs
  • Latching Function for Digital Outputs
  • TRIP-TEST Pin Allows In-System Testing
  • Low Power Minimizes Self-Heating to Under 0.02°C
  • See LM57-Q1 datasheet for AEC-Q100 Grade 1/Grade 0/Grade 0 Extended (Qualified and Manufactured on an Automotive Grade Flow)
  • Trip Temperature Set by External Resistors with
    Accuracy of ±1.7°C or ±2.3°C from -40°C to +150°C
  • Resistor Tolerance Contributes Zero Error
  • Push-Pull and Open-Drain Switch Outputs
  • Wide Operating Temperature and Trip-Temperature Range of −50°C to 150°C,
  • Very Linear Analog VTEMP Temp Sensor Output
    with ±0.8°C or ±1.3°C Accuracy from -40°C to +150°C
  • Short-Circuit Protected Analog and Digital Outputs
  • Latching Function for Digital Outputs
  • TRIP-TEST Pin Allows In-System Testing
  • Low Power Minimizes Self-Heating to Under 0.02°C

Description

The LM57 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature industrial applications. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to +150°C. The VTEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIP and VTEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER digital outputs will assert when the die temperature exceeds TTRIP and will de-assert when the temperature falls below a temperature equal to TTRIP minus THYST.

TOVER is active-high with a push-pull structure. TOVER is active-low with an open-drain structure. Tying TOVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVER or TOVER, confirming they changed to an active state. This allows for in-situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMP pin. The system could then use this voltage to calculate the threshold of the LM57.

The LM57 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature industrial applications. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to +150°C. The VTEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIP and VTEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER digital outputs will assert when the die temperature exceeds TTRIP and will de-assert when the temperature falls below a temperature equal to TTRIP minus THYST.

TOVER is active-high with a push-pull structure. TOVER is active-low with an open-drain structure. Tying TOVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVER or TOVER, confirming they changed to an active state. This allows for in-situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMP pin. The system could then use this voltage to calculate the threshold of the LM57.

Subscribe to Welllinkchips !
Your Name
* Email
Submit a request